Found 1 hit - Term: joint test action group, Database: *, Strategy: prefix
- [1] : The Free On-line Dictionary of Computing (27 SEP 03)
joint test action group
jtag, or "ieee standard 1149.1" a
standard specifying how to control and monitor the pins of
compliant devices on a printed circuit board.
each device has four jtag control lines. there is a common
reset trst and clock tclk. the data line daisy chains
one device's tdo pin to the tdi pin on the next device.
the protocol contains commands to read and set the values of
the pins and, optionally internal registers of devices.
this is called "boundary scanning". the protocol makes
board testing easier as signals that are not visible at the
board connector may be read and set.
the protocol also allows the testing of equipment, connected
to the jtag port, to identify components on the board by
reading the device identification register and to control and
monitor the device's outputs.
jtag is not used during normal operation of a board.
jtag technologies b.v. http://www.jtag.com/.
boundary scan/jtag technical information - xilinx, inc.
http://www.xilinx.com/support/techsup/journals/jtag/.
java api for boundary scan faqs - xilinx inc.
http://www.xilinx.com/products/software/sx/sxfaqs.htm.
jtag boundary-scan test products - corelis, inc.
http://www.corelis.com/products/scanovrv.html.
"logic analyzers stamping out bugs at the cutting edge", edn
access, 1997-04-10
http://www.ednmag.com/ednmag/reg/1997/041097/08df_02.htm.
ieee 1149.1 device architecture - boundary-scan tutorial from
asset intertech, inc.
http://www.asset-intertech.com/tutorial/arch.htm.
"application-specific integrated circuits", michael john
sebatian smith, published addison-wesley - design automation
cafe
http://www.dacafe.com/dacafe/edatools/edabooks/asic/book/ch14/ch14.2.htm.
software debug options on asic cores - embedded systems
programming archive http://embedded.com/97/feat9701.htm.
designing for on-board programming using the ieee 1149.1
jtag access port - intel
http://developer.intel.com/design/flcomp/applnots/292186.htm.
built-in self-test using boundary scan by texas instruments -
edtn network
http://www.edtn.com/scribe/reference/appnotes/md003e9a.htm.
1999-11-15
see also:
standard printed circuit board daisy chains protocol internal registers boundary scanning
lt;jtag technologies b.v.gt; lt;boundary scan/jtag technical information - xilinx, inc.gt; lt;java api for boundary scan faqs - xilinx inc.gt; lt;jtag boundary-scan test products - corelis, inc.gt; lt;"logic analyzers stamping out bugs at the cutting edge", edn access, 1997-04-10gt; lt;ieee 1149.1 device architecture - boundary-scan tutorial from asset intertech, inc.gt; lt;"application-specific integrated circuits", michael john sebatian smith, published addison-wesley - design automation cafegt; lt;software debug options on asic cores - embedded systems programming archivegt; lt;designing for on-board programming using the ieee 1149.1 jtag access port - intelgt; lt;built-in self-test using boundary scan by texas instruments - edtn networkgt;
Results 1 - 10 of 13 found about joint test action group: Action
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